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July 11th 2005 |
5th International Workshop on Formal Approaches FATES 2005 Hold in conjunction with CAV 2005 Preliminary program now available Register soon!
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Software testing is one of the most cost-intensive tasks in the modern software production process. The application of formal approaches to the testing process has gained steady attention in recent years. Effective and efficient test cases may be generated automatically from formal system models and specifications or be developed based on a formal analysis of the system. Formal approaches to testing use techniques from areas like theorem proving, model checking, constraint resolution, program analysis, abstract interpretation, Markov chains, and various others. These techniques are combined with traditional approaches to testing.
The aim of the FATES workshop series is to be a forum for researchers, developers, and testers to discuss the state of the art in theory, application, tools and industrialization of formal approaches to testing. FATES 2005 puts a particular emphasis on tools and applications.
Deadline for submissions (Extended): April 15, 2005
Notification of acceptance: (Postponed) May 27, 2005
Workshop-proceedings version: June 20, 2005
Workshop: July 11, 2005
LNCS proceedings paper version: approx. September 2005
Wolfgang Grieskamp,
Microsoft
Research, Redmond, USA
e-mail:
wrwg@microsoft.com
home page:
http://research.microsoft.com/users/wrwg
Carsten Weise, Ericsson GmbH,
Research and Development, Aachen, Germany
e-mail:
carsten.weise@ericsson.com
home page:
http://www.cweise.de/research/
The 1st FATES was hold in affiliation with CONCUR 2001 in Aalborg, Denmark (http://fmt.cs.utwente.nl/conferences/fates), the 2nd FATES in affiliation with CONCUR 2002 in Brno, Czech Republic (http://www.brunel.ac.uk/~csstrmh/concur2002/fates.html). In 2003, FATES was hold in affiliation with ASE in Montreal, Canada (http://www.crim.ca/fates), and in 2004 again with ASE in Linz, Austria (http://fates.cs.auc.dk). Since 2003, the workshop proceedings are published by Springer (LNCS series).