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3D LayoutCRF for Multi-View Object Class Recognition and Segmentation

D. Hoeim, C. Rother, and J. Winn

Details

Publication typeInproceedings
Published inProc. IEEE Computer Vision and Pattern Recognition (CVPR)
AddressMinneapolis, US

Newer versions

John Winn and Jamie Shotton. Markov Random Fields for Object Detection, MIT Press, 2011.

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