Relevance assessment: are judges exchangeable and does it matter

Peter Bailey, Nick Craswell, Ian Soboroff, Paul Thomas, Arjen P. de Vries, and Emine Yilmaz

Details

Publication typeInproceedings
Published inSIGIR '08: Proceedings of the 31st annual international ACM SIGIR conference on Research and development in information retrieval
URLhttp://doi.acm.org/10.1145/1390334.1390447
Pages667–674
ISBN978-1-60558-164-4
AddressNew York, NY, USA
PublisherACM
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