Andrew Begel and Nachiappan Nagappan
October 2008
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In: ESEM '08: Proceedings of the Second ACM-IEEE International Symposium on Empirical Software Engineering and Measurement
Publisher: ACM
| Type: | Inproceedings |
| URL: | http://doi.acm.org/10.1145/1414004.1414026 |
| Pages: | 120–128 |
| ISBN: | 978-1-59593-971-5 |
| Address: | New York, NY, USA |