> Publications > Fault-aware Fingerprinting: Towards Mutualism between Failure Investigation and Statistical Debugging
Chao Liu and Jiawei Han
2006
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In: SIGSOFT '06/FSE-14: Doctoral Symposium at the 14th ACM SIGSOFT international symposium on Foundations of software engineering
Publisher: ACM Press
| Type: | Inproceedings |
| ISBN: | 1-59593-468-5 |
| Address: | New York, NY, USA |