Share on Facebook Tweet on Twitter Share on LinkedIn Share by email
Fault-aware Fingerprinting: Towards Mutualism between Failure Investigation and Statistical Debugging

Chao Liu and Jiawei Han

Details

Publication typeInproceedings
Published inSIGSOFT '06/FSE-14: Doctoral Symposium at the 14th ACM SIGSOFT international symposium on Foundations of software engineering
ISBN1-59593-468-5
AddressNew York, NY, USA
PublisherACM Press
> Publications > Fault-aware Fingerprinting: Towards Mutualism between Failure Investigation and Statistical Debugging