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Characterizing Flash Memory: Anomalies, Observations, and Applications

Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, Steven Swanson, Eitan Yaakobi, Paul H. Siegel, and Jack K. Wolf

Details

Publication typeInproceedings
Published inMICRO 42: Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
URLhttp://doi.acm.org/10.1145/1669112.1669118
Pages24–33
ISBN978-1-60558-798-1
AddressNew York, NY, USA
PublisherACM
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