Characterizing Flash Memory: Anomalies, Observations, and Applications

Micro2009_FTest.pdf
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In  MICRO 42: Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture

Publisher  ACM

Details

TypeInproceedings
URLhttp://doi.acm.org/10.1145/1669112.1669118
Pages24–33
ISBN978-1-60558-798-1
AddressNew York, NY, USA
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