Test Coverage and Post-Verification Defects: A Multiple Case Study

In  Proceedings of the ACM-IEEE Empirical Software Engineering and Measurement Conference (ESEM)

Publisher  IEEE Computer Society
Copyright © 2009 IEEE. Reprinted from IEEE Computer Society. This material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Details

TypeInproceedings
> Publications > Test Coverage and Post-Verification Defects: A Multiple Case Study