David Lo, G Ramalingam, Venkatesh Prasad Ranganath, and Kapil Vaswani
|Published in||Proceedings of the Working Conference on Reverse Engineering (WCRE)|
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Venkatesh-Prasad Ranganath, Pradip Vallathol, and Pankaj Gupta. Compatibility Testing via Patterns-Based Trace Comparison, Microsoft Research, 18 August 2012.